I I I Test of semiconductors Test of discrete components Rugged and compact
In conjunction with an oscilloscope, the component tester HZ65 can be used to test semiconductor components, resistors, capacitors and inductors not only out-ofcircuit, but also often without desoldering them from circuit boards. Within certain limits, testing of integrated circuitry is also possible. Transistors can be plugged into two 3-point sockets; any combination of 2 contacts may be selected for testing. This simplifies testing of different internal transistor paths (base-emitter, emittercollector, base-collector). Components with larger-diameter leads and ICs are connected to the 2 jacks on the side of the HZ65 using 2 test cables. The direction of current flow through the tested component or IC can be
reversed. The HZ65 is particularly indispensable for repairs of electronic devices, providing good-bad information within seconds. This also allows quick comparison of the unit under test with a known good component or network. Accessories supplied: Two test cables (red and black) with probes and banana plugs (HZ56) Optional accessories: BNC cable HZ33, HZ34
Specifications Test principle Display of component signatures on an oscilloscope in X-Y mode. Two-point testing. Test objects Semiconductor components of all kinds (except power electronics), Resistors (up to approx. 5 k), Capacitors (10nF- 100 F), LF ferrite-core inductors. Test inputs Pair of 4-min jacks (red and black) for 2 test leads (included).
Test current Switchable in 3 steps: Max. approx. 200mAeff Med. approx. 50mAeff Min. approx, 5mAeff (if test leads are short-circuited). Oscilloscope connections Connection by means of 2 BNC jacks on the side of the unit (grounded by way of power cord). X output (voltage) for horizontal deflection. Y output (current) for vertical deflection. Power requirements 115V or 230V 10%. (internel selectable) Line frequency 50-60 Hz. Power consumption: max. 6.5 watts. Built-in oveicurrent protection. LED pilot lamp indicates operation. Tested at: 3kV 50Hz. Limited short-circuit protection (max. 5 min.) Power cord with grounding (3-prong) plug, length: approx. 1,6 m. Enclosure Made of non-conductive polystyrene. Dimensions: 137mm x 80mm x 52 mm (L x W x H) Total weight: approx. 600g 5

The black banana jack is grounded !
Two 3-point transistor sockets (any combination of 2 contacts may be selected for testing). Test frequency Sine-wave 50Hz Test voltage No-load voltage approx. 8.2Veff
General Information The component tester HZ65, used in conjunction with an oscilloscope, permits time-saving tests of semiconductors of all kinds (exception: power electronics), resistors, capacitors and inductors. It is exceptionally easy to operate. Evaluation of the graphical test patterns requires a certain amount of experience, but this is rapidly acquired if the tester is used frequently. To support this process, a number of typical component signatures are illustrated at the back of these instructions. The HZ65 has been constructed and tested in accordance with the stipulations of IEC1010-1, which govern protective measures for electronic test instruments, and it has left the factory with all safety features in perfect working order. In order to maintain it in this condition and guarantee safe, nonrisk operation, the user should observe all notes and warnings contained in these operating instructions.
Damage to the unit If there is reason to believe that the unit may no longer be safely operated, then it must be powered down and protected against accidental activation. This is the case if: The unit exhibits visible damage The unit contains loose parts The unit no longer functions The unit has been stored under unfavorable conditions (e.g. out of doors or in a moist area) for a long period of time The unit has been subjected to ahnornial stresses during transport (e.g. as a result of not being packaged in accordance with the minirnurn requirements of the postal service, railway or shipping company).
The BNC jacks and the black banana jack are grounded by way of the 3-conductor power cord of the HZ65. In general, this will have no effect on out-of-circuit testing of individual components. When performing incircuit tests, however. Steps must be taken to ensure that no currents are flowing within the circuit. In the case of circuits which are themselves grounded by way of their power connection, it is necessary to pull the power plug of the component tester. Double grounding can load to incorrect test results.
Warranty A limited warranty is granted covering proper functioning of the HZ65 for a period of 2 years. This warranty is void if unauthorized changes have been made on the unit. When mailing or shipping by rail, we recommend packaging the unit very carefully. Damage caused during transport by inadequate packaging is exempted from the warranty. When exercising this warranty, we advise attaching a note to the housing of the unit briefly deseribing the observed fault or faults. You will receive faster service if you include your name and telephone number (including area code and extension or department designation) in case we require additional information. Environmental conditions Permissible ambient temperature range during operation: + 10 to +40C. Permissible temperature range for storage and transport: -40C to +70C. If the unit has been kept at temperatures below the dew point (the temperature at which water vapour begins to condense), then it must be acclimated for a certain minimum time period before powering up. In extreme cases (if the HZ65 is much colder than the dew point), it is necessary to wait approx. 2 hours at room temperature before beginning operation. The unit is designed for use in clean, dry roorns. It must not be operated if there is a high incidence of airborne dust, high relative humidity, risk of explosions, or if aggressive chemicals are present in the environment. The unit may be operated in any position, provided that there is unhindered air circulation (convection cooling).

Warning When opening or closing the enclosure, when performing repairs or maintenance, and when replacing parts. the unit must be isolated from all voltage sources. If, after doing so, it is absolutely necessary to carry out measurements. troubleshooting or adjustments on the opened unit while it is under a live voltage, then this may only be done by a trained technician who is familiar with the associated risks and dangers.
Make ready and presettings Upon delivery, the unit is set to operate on 230V 10% (50-60Hz). Conversion for operation on 115V 10% is performed in the inside of the unit by resoldering of wired jumpers. Always pull the power plug before opening the HZ65! After rnaking sure that this has been done, remove the 4 screws on the base of the unit and lift off the cover. Next to the encapsulated input transformer is a row of 5 lands, to wich the isolated wired jumpers shold be attached as shown in the following diagram (series- or parallel connection of the primary coil). Line overcurrent protection:

isolated wire

Fuse: T 50mA for 230 V

isolated wires

Fuse: T 100mA for 115 V The line overcurrent protection device must have a rating which corresponds to the selected line voltage, and must therefore be replaced when changing over. For type information, consult the circuit diagram. Once you have made sure that the line voltage and overcurrent protection device correspond arid the enclosure has been closed, the 2 BNC jacks rnay be connected to the oscilloscope using the corresponding BNC cables: X (voltage) = Horizontal input Y (current) = Vertical input It the oscilloscope has a different jack type, the BNC jacks can be connected using apropriate adaptors. For connecting the component tester to the oscilloscope, BNC-BNC cables such as HZ31, HZ33, and HZ34, also supplied by HAMEG, are suitable. For oscilloscopes equipped with banana jacks, the connection cable HZ32 8NC may be used with 4-mm banana plugs. If you construct your own adaptor, make sure that the frames of the BNC jacks of the HZ65 are also connected with the oscilloscope chassis for grounding purposes. Consult the operating instructions for the oscilloscope, and set it to X-Y mode or external X deflection, as well as - if possible- DC input coupling. After the component tester and oscilloscope have been powered up, a horizontal baseline should appear in the oscilloscope screen. Use the Horizontal control to adjust the length of the base-line to approx. half of screen width. If the 2 banana jacks of the HZ65 are shorted, a vertical line appears on the oscilloscope screen. Use the Y time-division control of the oscilloscope to adjust its length to about half of screen height. The HZ65 is now ready for operation. It is a good idea to make a note of the oscilloscope settings so that quick tests can be performed with the HZ65 in the middle of other tasks. Avoid operating the HZ65 for lengthy periods of time with shorted inputs and maximum current. I t is advisable to set the current switch of the HZ65 to minimum level after each test. This prevents any damage from occurring if the 2 test cables should accidentally be shorted on the test bench.

Test principle The built-in frequency generator provides a sinusoidal voltage at the same frequency as the line voltage, which is then applied to the series circuit consisting of the test object and a built-in switchable resistor. In the case of resistors or other non-complex components, the 2 deflection voltages are in phase and a snore or less diagonal line will appear on the oscilloscope screen. If the test cables are shorted, a vertical llins is displayed. If the leads are open, a horizontal line will result. Capacitors and inductors cause a phase difference between current and voltage, and thus between the 2 deflection voltages. The result is ellipsoidal traces. The slope and width of the ellipses are indicative of the impedance. In the case of semiconductors, a voltage-induced sharp change in direction in the curve can be observed at the transition point from the conductive to the nonconductive state. To the extent permitted by the applied test voltage, the forward and reverse characteristics of semiconductor components are displayed (e.g. for a zener diode below 12V, etc.). Only 2-point measurements can be performed; for this reason, transistor gain and the like cannot be measured with the HZ65.
Since only a few volts are applied to the test object, non-destructive testing is possible of the individual zones of almost all semiconductors.
Direct in-circuit testing is possible in rnany cases, however, parallel circuits with other, complex components can cause significant changes in the curve traces. Nevertheless, with a certain amount of experience or by comparing with the traces of known functional circuits, faulty components can be quickly identified. In cases of doubt, one of the component leads can be desoldered.
Carry out tests with the HZ 65 only in circuits in which no currents are flowing (otherwise there is a risk of damage to the circuit and the tester).
Oscilloscope types The HZ 65 can be connected to any oscilloscope with X and Y inputs (in X-Y mode or external X deflection). Testing Individual components with thin leads can be tested most quickly out-of-circuit by plugging them into one of the 2 socket contacts for testing. The included test cables can be connected to the HZ 65 for in-circuit testing of components or testing of components with leads that will riot fit into the sockets. Use the lower slide switch (current) to adjust the test current. The recommended settings are as follows: Diodes, small-signal trans., FETs.: Thyristors, triacs: Resistors up to 5k: Up to 500: Up to 50: Unpolarized capacitors up to 1F: Up to 10F: Over 10F: Medium Maximum Minimum Medium Maximum Minimum Medium Maximum
Component testing Out-of-circuit testing of individual components is unproblematic. Qualitative results are obtained by comparing with known good components of the same type and rating. This also applies to semiconductors. For example, it is possible to quickly determine which lead is the cathode on a diode or zener diode with illegibly printed designations, to identify NPN or PNP transistors, or to obtain emitterbase-collector identification on unknown transistor types. Even more important is the ability to quickly obtain a good-bad evaluation of components in the case of interruptions or shorts, which experience has shown is what servicing jobs most often require.

It is urgently advised to exercise the usual caution when handling individual MOS components as regards electrostatic charges.
It is not quite as simple to obtain usable results when performing in-circuit testing. As a result of parallel connection of components with real and complex characteristics - especially if these have relatively low impedances at 50Hz - significant differences are often obtained compared to out-ofcircuit testing of
individual components. If you must frequently test circuits of the same type (service department), then here, too, it is useful to compare the trace pattern with that of a functional circuit. This is especially quick and easy to do, since the second circuit used for purposes of comparison need not (and must not!) be placed under power. Using the test cables, simply probe the corresponding pairs of test points and compare the trace patterns obtained. At times, the circuit under test will itself contain the circuit for comparison, e.g. in the case of stereo channels and symmetrical bridge circuits. In cases of doubt, one lead of the component in question can be desoldered. This lead is then connected with the red test jack of the HZ65, in order to reduce hum. The black test jack is directly connected with the oscilloscope chassis, and is not sensitive to hum. Drum can also become visible on the oscilloscope screen if the base or gate of a single transistor is open, in other words it it is not being tested at the moment (due to body effect).
The following should be stressed once again: Tests with the HZ65 may only be performed on components, modules or circuits in which no currents are flowing.
HAMEG GmbH Industriestr. 6 D-63533 Mainhausen Tel. 06182/800-0 FAX 06182/800-100 8
140998-HE/sch Printed in Germany nderungen vorbehalten / Subject to change without notice
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